The University of Maryland MRSEC grants ended in September 2013 after 17 years of successful operation. This site remains as a history of the center, but will not be actively maintained.
University of Maryland
Materials Research Science and Engineering Center
Shared Experimental Facilities (SEF)
X-ray Photoelectron Spectroscopy (XPS)
Overview:
This X-ray photoelectron spectroscopic facility provides compositional, oxidation-state, and depth profiling analysis of solid materials. Two X-ray sources and efficient charge neutralization make this instrument suitable for the analysis of conducting and nonconducting samples. The XPS is integrated with Department of Chemistry & Biochemistry's Shared Instruments for materials chemical analysis.
Instrument Designation:
- Kratos Axis 165
Key Specifications:
- Two x-ray sources: Monochromatic Al and Dual anode (Mg/Al)
- High sensitivity is achieved with a combination of electrostatic and magnetic lenses, a 165 mm hemispherical analyzer and multi channeltron detection
- Coaxial charge neutralization system
- Variable temperature (150-750 K) sample stage
- XPS imaging (30 micron spot) and multipoint spectroscopy
- Depth profiling with argon ion bombardment
- Automated sample stage and XYZ manipulator for angle resolved measurements
- High vacuum loadlock and preparative chamber
- Sample holder capable of holding multiple samples
- Kratos Vision and CASA XPS analysis software
Contact:
Dr. Karen Gaskell
XPS Facility Manager
(301) 405-4999
Contact Us | Page Last Updated: 01/24/14 | Site Map
