The University of Maryland MRSEC grants ended in September 2013 after 17 years of successful operation. This site remains as a history of the center, but will not be actively maintained.

Shared Experimental Facilities (SEF)

Transmission Electron Microscopy Facilities

Overview:

Two powerful transmission electron microscopes (TEM) provide structural and compositional analysis of hard and soft materials with sub-nanometer resolution. These TEM's are integrated with additional microscopy (SEM, AFM) and sample preparation facilities in the University's central NISPLAB.

JEOL JEM 2100 Field Emission TEM/STEM

JEOL JEM 2100 LaB6 TEM

Instrumentation:

JEOL JEM 2100 Field Emission TEM/STEM
Specifications: Electron Gun: ZrO/W(100) field emission
Resolution: 0.19 nm (point-to-point), 0.10 nm (lattice)
Spot Size: 2-5 nm (TEM mode); 0.5 - 2.4 nm (analytical mode)
Two CCD Cameras
Analytical Modes: Scanning TEM (Bright & Dark Field); Resolution: 0.2 nm (lattice)
Energy-Dispersive X-ray Spectrometer (EDS)
Electron Energy Loss Spectrometer (EELS)
Energy Filter TEM (EFTEM)
JEOL JEM 2100 LaB6 TEM
Specifications: Electron Gun: LaB6 thermionic emission
Resolution: 0.23 nm (point-to-point), 0.14 nm (lattice)
Spot Size: 20 - 200 nm (TEM mode), 1.0 - 25 nm (analytical mode)
Specimen Tilt: +/- 30o One CCD and One TV Cameras
Analytical Modes: Conventional TEM
Energy Dispersive X-ray Spectrometer (EDS)
Tomography
In-Situ TEM (with Special Holders) for:
    High Temperature Heating TEM
    Cryo-TEM
    Lorentz Microscopy

Contact:

Nisplab Director

Dr. Wen-An Chiou

wachiou@umd.edu

(301) 405-0541

Contact Us | Page Last Updated: 05/01/09 | Site Map