The University of Maryland MRSEC grants ended in September 2013 after 17 years of successful operation. This site remains as a history of the center, but will not be actively maintained.
Two powerful transmission electron microscopes (TEM) provide structural and compositional analysis of hard and soft materials with sub-nanometer resolution. These TEM's are integrated with additional microscopy (SEM, AFM) and sample preparation facilities in the University's central NISPLAB.
JEOL JEM 2100 Field Emission TEM/STEM | |
Specifications: | Electron Gun: ZrO/W(100) field emission Resolution: 0.19 nm (point-to-point), 0.10 nm (lattice) Spot Size: 2-5 nm (TEM mode); 0.5 - 2.4 nm (analytical mode) Two CCD Cameras |
Analytical Modes: | Scanning TEM (Bright & Dark Field); Resolution: 0.2 nm (lattice) Energy-Dispersive X-ray Spectrometer (EDS) Electron Energy Loss Spectrometer (EELS) Energy Filter TEM (EFTEM) |
JEOL JEM 2100 LaB6 TEM | |
Specifications: | Electron Gun: LaB6 thermionic emission Resolution: 0.23 nm (point-to-point), 0.14 nm (lattice) Spot Size: 20 - 200 nm (TEM mode), 1.0 - 25 nm (analytical mode) Specimen Tilt: +/- 30o One CCD and One TV Cameras |
Analytical Modes: | Conventional TEM Energy Dispersive X-ray Spectrometer (EDS) Tomography In-Situ TEM (with Special Holders) for: High Temperature Heating TEM Cryo-TEM Lorentz Microscopy |
Nisplab Director
Dr. Wen-An Chiou
(301) 405-0541
Contact Us | Page Last Updated: 05/01/09 | Site Map